Failure Analysis of Electronics Short Course

Electronic Supply Chain Solutions knows that quality of devices depends on many factors that can lead to failure. ESCS would like to share with you what we feel could be some great QUALITY LESSONS LEARNED so mark your canendar! Any questions should be directed to the contact listed below. Be quality minded and combat counterfeits with quality lessons learned from ESCS. 

 

An intensive 4-day course on “Failure Analysis of Electronics” is being offered jointly by CALCE and Buehler, on November 6-9, 2012. The course, which covers failure analysis techniques such as specimen preparation and materials analysis for electronic assemblies, components, and devices, will consist of a combination of classroom instruction, demonstrations, and hands-on laboratory training. Lecture topics include physics-of-failure-based root cause analysis, guidelines for selection of analytical tools, and practical instruction on laboratory techniques. The laboratory segment of the course includes demonstrations and step-by-step sample preparation using metallographic techniques. In addition, a number of case studies will be presented. These case studies will illustrate the step-by-step process of uncovering important pieces of information that can lead to the isolation of a failure site and root cause determination.

The course will be held at the College Park campus of the University of Maryland. Please click here (www.calce.umd.edu/facourse) or contact Bhanu Sood at 301-405-3498 or by email at bpsood@calce.umd.edu for additional details.

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Counterfeit Electronics - Risks and Mitigation

Another Quality Lessons Learned

Two Part Webtorial, August 14 and 21, 2012

 1:00 - 2:30 pm EDT

Overview

Center for Advanced Life Cycle Engineering (CALCE) provides efficient and cost-effective failure analysis services, counterfeit parts inspection, design reviews, reliability audits, and warranty cost analysis assessment assistance for all interested parties. In the parts procurement process, the purchase of an electronic part from a part manufacturer or its authorized supplier presents very low risk. However, parts are often purchased from unauthorized sources such as independent distributors and part brokers for a variety of reasons, including part obsolescence, lead time, or unavailability of parts from authorized sources. There is a need for authentication and screening of the parts purchased from such sources to verify their authenticity. CALCE provides component authentication and screening services through its Test Services and Failure Analysis Laboratory to verify the authenticity of parts.

Topics Covered

This two-part webtorial on parts inspection and materials characterization begins with a brief primer on the diverse counterfeit electronic part creation techniques, including the recently discovered “media-blasting” method. The webtorial then discusses the effectiveness of various non-destructive techniques and destructive processing steps for inspecting suspect counterfeit components that are created using diverse techniques. The case studies illustrate the use of an array of analysis techniques to assist in determining the authenticity of an electronic part.  Inspection techniques that are discussed in the webtorial include:

·        Optical microscopy

·        X-ray microscopy

·        Acoustic microscopy, decapsulation, die inspection

·        X-ray fluorescence (XRF) spectroscopy

·        Scanning electron microscopy (SEM) / energy dispersive spectroscopy (EDS)

·        Materials characterization tools (FTIR, IC, TGA, DSC, etc.)

·        Electrical testing

Who Should Attend?

Component engineers, failure analysis engineers, reliability engineers, engineering managers, procurement managers, quality assurance personnel, contracts personnel, and anyone who is involved in policy-making activities in the fields of marketing or procurement of electronics parts and assemblies.

About the Presenter

Bhanu Sood (bpsood@calce.umd.edu) is the Director of the Test Services and Failure Analysis Laboratory at CALCE. Bhanu’s research areas at CALCE include development of analysis methodologies for component- and PCBA-level failures, materials characterization techniques for counterfeit parts identification, and investigating failure mechanisms in printed circuit boards. Prior to joining CALCE, Bhanu worked at the Naval Research Laboratory in the areas of embedded electronics, embedded batteries, and laser-assisted micro-fabrication techniques. Bhanu holds a US Patent for a laser-based technique for the transfer and embedding of electronic components and devices.

Registration

Registrations are being taken through the SMTA Online Registration System, please visit

http://www.smta.org/education/registration/event_registration.cfm?EVENT_ID=811

This post is provided by Electronic Supply Chain Solutions an AS9120 cetified franchised distributor of electronic components